FRT Newsbereich
Here you will find current and recent press releases about our products and the company FRT.
For inclusion in our press distribution list or inquiries regarding interviews and imagery please contact:

Dr. Oliver Schillings
Alpha & Omega Public Relations
Am Mühlenberg 47
51465 Bergisch Gladbach
Germany
o.schillings@aopr.de

To request our comprehensive press kit with thorough information about FRT, please click here


December 2008 Monday, December 1, 2008
FRT Exhibits at 1. Rusnanotech Show Surface measurements "Made in Germany" for the growth market Russia
Russia strives to establish itself as a premier location for nanotechnology in the world and advocates foreign direct investments to initiate the more...


September 2008 Monday, September 29, 2008
Surface Measurement Systems for Semiconductor Applications: FRT covers two important trends at this years Semicon Europa
Small surfaces and very thin films are increasingly important in the MEMS, semiconductor and photovoltaic industries. Comparably complex are the more...


April 2008 Tuesday, April 1, 2008
Industry Award 2008 for Confocal Microscope MicroSpy Topo
FRT (Fries Research & Technology GmbH), worldwide supplier of tools and systems for the non-destructive analysis of surfaces has received the more...


November 2007 Thursday, November 1, 2007
FRT taps new price segment with Economy Class Measuring Instruments
Premiere for confocal microscope MicroSpy® Topo. FRT (Fries Research & Technology), a manufacturer of surface metrology instruments for the more...


October 2007 Monday, October 1, 2007
Remotely Increased Service
Fries Research & Technology GmbH (FRT) introduces new remote support system. FRT has just extended its after-sales-services by a remote support more...


July 2007 Tuesday, July 31, 2007
FRT introduces new film thickness and surface measurement sensors
The international surface metrology company Fries Research & Technology just introduced two new sensors. The CWL HR, is a high-resolution chromatic more...


April 2007 Monday, April 2, 2007
New Series of Fully Automated Metrology Tools for the Integrated Production Control of Wafers and MEMS
With increasingly smaller surface structures, semiconductor and MEMS manufacturers need to run integrated metrology checks on wafers and other more...


November 2006 Wednesday, November 1, 2006
FRT GmbH Bridges the Gap Between Dimensions – Optical Measuring System with White Light Interferometer, AFM and AFAM
In order to bridge the gap from meter to nanometer, Fries Research & Technology offers optical surface measuring systems like the MicroGlider® and more...


August 2006 Tuesday, August 1, 2006
Multi-Sensor Metrology Increasingly Popular in Industrial Environments
Multi-sensor measuring systems more and more conquer the market for industrial metrology. An increased demand is especially observed in the field of more...


May 2006 Monday, May 1, 2006
Non-contact measurement of spherical, aspherical, and cylindrical surfaces
FRT GmbH in Bergisch Gladbach, Germany has extended its portfolio of highly precise surface measuring systems by yet another innovative product. more...


April 2006 Saturday, April 1, 2006
On-the-spot inspection of cylinder bores
Fries Research & Technology GmbH (FRT) has developed a mobile measuring system for the automotive industry. The portable MicroProf® Cylinder more...


March 2006 Wednesday, March 1, 2006
FRT opens new branch office in Munich
FRT GmbH in Bergisch Gladbach, Germany has just announced to open up another branch office in Germany. Along with the 10th anniversary of the more...


February 2006 Wednesday, February 1, 2006
New Metrology Tool for Microelectronics and Semiconductors
Semiconductors as well as MEMS are often produced on wafers with diameters from 150 mm to 300 mm. During manufacturing, the wafers (silicone, glass more...