|
|
December 2008 |
 |
Monday, December 1, 2008
FRT Exhibits at 1. Rusnanotech Show
Surface measurements "Made in Germany" for the growth market Russia |
Russia strives to establish itself as a premier location for nanotechnology in the world and advocates foreign direct investments to initiate the more...
|
|
|
September 2008 |
 |
Monday, September 29, 2008
Surface Measurement Systems for Semiconductor Applications: FRT covers two important trends at this years Semicon Europa
|
Small surfaces and very thin films are increasingly important in the MEMS, semiconductor and photovoltaic industries. Comparably complex are the more...
|
|
|
April 2008 |
 |
Tuesday, April 1, 2008
Industry Award 2008 for Confocal Microscope MicroSpy Topo |
FRT (Fries Research & Technology GmbH), worldwide supplier of tools and systems for the non-destructive analysis of surfaces has received the more...
|
|
|
November 2007 |
 |
Thursday, November 1, 2007
FRT taps new price segment with Economy Class Measuring Instruments |
Premiere for confocal microscope MicroSpy® Topo. FRT (Fries Research & Technology), a manufacturer of surface metrology instruments for the more...
|
|
|
October 2007 |
 |
Monday, October 1, 2007
Remotely Increased Service |
Fries Research & Technology GmbH (FRT) introduces new remote support system. FRT has just extended its after-sales-services by a remote support more...
|
|
|
July 2007 |
 |
Tuesday, July 31, 2007
FRT introduces new film thickness and surface measurement sensors |
The international surface metrology company Fries Research & Technology just introduced two new sensors. The CWL HR, is a high-resolution chromatic more...
|
|
|
April 2007 |
 |
Monday, April 2, 2007
New Series of Fully Automated Metrology Tools for the Integrated Production Control of Wafers and MEMS |
With increasingly smaller surface structures, semiconductor and MEMS manufacturers need to run integrated metrology checks on wafers and other more...
|
|
|
November 2006 |
 |
Wednesday, November 1, 2006
FRT GmbH Bridges the Gap Between Dimensions – Optical Measuring System with White Light Interferometer, AFM and AFAM
|
In order to bridge the gap from meter to nanometer, Fries Research & Technology offers optical surface measuring systems like the MicroGlider® and more...
|
|
|
August 2006 |
 |
Tuesday, August 1, 2006
Multi-Sensor Metrology Increasingly Popular in Industrial Environments
|
Multi-sensor measuring systems more and more conquer the market for industrial metrology. An increased demand is especially observed in the field of more...
|
|
|
May 2006 |
 |
Monday, May 1, 2006
Non-contact measurement of spherical, aspherical, and cylindrical surfaces |
FRT GmbH in Bergisch Gladbach, Germany has extended its portfolio of highly precise surface measuring systems by yet another innovative product. more...
|
|
|
April 2006 |
 |
Saturday, April 1, 2006
On-the-spot inspection of cylinder bores |
Fries Research & Technology GmbH (FRT) has developed a mobile measuring system for the automotive industry. The portable MicroProf® Cylinder more...
|
|
|
March 2006 |
 |
Wednesday, March 1, 2006
FRT opens new branch office in Munich |
FRT GmbH in Bergisch Gladbach, Germany has just announced to open up another branch office in Germany. Along with the 10th anniversary of the more...
|
|
|
February 2006 |
 |
Wednesday, February 1, 2006
New Metrology Tool for Microelectronics and Semiconductors |
Semiconductors as well as MEMS are often produced on wafers with diameters from 150 mm to 300 mm. During manufacturing, the wafers (silicone, glass more...
|