The MicroProf® is a very versatile and modular measuring tool that is suited for a wide range of applications. No matter what you are planning to measure, whether it is profile, roughness, topography or film thickness, this system is a true all-rounder. Most importantly, it is very easy to use, expandable, can be automated and provides instant visible results for a time - and cost efficient operation.
Available Sensors FRT Brochure FRT Software Package

measurement of metal surface	profile of an embossed structure	structures on a semiconductor part

non-destructive measurement excellent resolution outstanding repeatability and reproducibility automated measuring cycles sample positioning with CCD camera versatility through modular conception multi-sensor capability chromatic white light or AFM sensor compact x,y stage for perfect orthogonality high precision mechanical axes high resolution linear glass scales backlash-free, re-circulating ball spindles rugged and stable granite mount industrial computer, monitor, electronics, and manual

FRT Acquire Measuring Software macro collection for typical measuring applications automation of complex measurements intuitive user interface design FRT Mark III Analysis Software complete analysis of the generated data (2D and 3D) logging of analysing steps and results customizable reports various data import and export formats English and German language sets free updates