A punctiform laser beam gets focused by an oscillating lens on the surface of the object. The reflected light get focused on a pinhole and enters a detector. Only if the object‘s surface is in the focal position, the detector receives a significant signal. The information on the corresponding height at the measuring point is obtained from the z-position of the oscillating lens.
	non-contact measurement high-resolution measurement precise results even with changes in the surface reflectance at different measurement positions fast measurements even on surfaces with very low reflectance	Download Options   Product Sheet   Company Brochure
	fast topography and profile measurement even on sensitive and soft materials measurement of microstructures measurement of ground and polished optical components control of electronic componentsinspection of tools and products in the field of plastic injection moulding inspection of dimensions, step-height etc. on printed circuit boards
	measuring range z 1000 µm  measuring distance 4 mm  measuring rate max. 1000 Hz  resolution z 20 nm  resolution x,y  1 µm  measuring angle 1 approx. 90°± 25°  light source 2 class 2 semiconductor laser, 660 nm 1 Diffusive surfaces allow for wider measuring angles. 2 In accordance with DIN EN 31252 Technical specifications and content are subject to change.