The measurement is based on conoscopic holography. A laser beam is focused on the specimen. The light that is scattered in the measuring spot is captured by the sensor. A configuration of two polarizers and one uni-axial crystal splits the captured light into two light beams that pass the crystal at different speeds. This leads to a superposition on the detector. The distance between lens and specimen is evaluated from the resulting double slit interference pattern.
	non-destructive, non-contact measurement wide working range and measuring bandwidth very well suited for steep edges coaxial measurement, no shading effects	Download Options   Product Sheet   Company Brochure
measurement of tire measurement of cam shaft
	quality assurance in automotive industry (interior, cylinders, shafts, electronics etc.) profile measurements of lens contours profile and 3D measurements roughness determination on technical surfaces (tools, cylinders, finished products etc.) dimension measurement of MEMS measurement of wafer flatness R&D and Q&A in MEMS R&D and Q&A in medical technology (catheters, prostheses etc.)
	focal length of lens 25 mm  50 mm 75 mm 100 mm  light source class 1 laser diode   measuring range 1.8 mm 8 mm 18 mm 35 mm  working distance 15 mm 42 mm 65 mm 90 mm  resolution z < 0.4 µm < 1 µm < 2 µm < 4 µm  resolution x 1 12 µm 15 µm 25 µm 35 µm  measuring angle  to surface approx. 90° ± 70° 1 Due to its elliptical measuring spot, the x-resolution is better than the y-resolution.    Technical specifications and content are subject to change.