Measuring Service - We offer Solutions for Your Needs
Fries Research & Technology possesses unique and extensive knowledge in the field of understanding material surfaces. Not only do we determine topography, roughness, hardness and chemical composition using the most efficient, state-of-the-art measuring methods, but also more importantly, provide you with concrete solutions for your materials and applications. This is a service of invaluable use, not only for new developments but for process optimization and damage analysis as well.

The scanning probe methods (SPM) are one of our main fields, with a major focus on scanning force microscopy (AFM). These methods allow the determination of topography, roughness, magnetic or mechanical properties with a very high lateral resolution of a few nm.
 
 

 
AFM image of a corrosion attacked galvanic coatingREM image of a manufactured phosphate layer Valuable know-how
Upon request, our "contract measurement" department can apply all surface-related analysis methods. A custom-designed concept, involving the process of the different measurements required, would be worked-out with you, so that the resulting conclusions have meaning upon which you can act.

Left: AFM image of a corrosion attacked galvanic coating
Right: REM image of a manufactured phosphate layer

 

Nano-/micro-hardness test on tool steel (force-depth-curve)indentation in steel bolt Excellent technical equipment
For example, the Hysitron TriboScope™ in combination with the AFM allows very precise, high local resolution and high force, nano-/micro-hardness hardness measurements. Complementing the above mentioned methods, the FRT MicroProf® and the FRT MicroGlider
® are used for the measurement of larger sample areas.


Left: Nano-/micro-hardness test on tool steel (force-depth-curve), right: indentation in steel bolt
EDX element distribution of titanium nitride in steel EDX spectrum of titanium nitride in steelContract measurement for many applications
REM/EDX allows the local and point determination of element composition and the element mapping of almost any sample.

These methods used in combination with chemical surface analyses (e.g. GDOS, XPS, TOF-SIMS) offer all the possibilities of optimal process control, comprehensive damage analysis or R&D, particularly in the areas of corrosion prevention, thin film technology, micro system technology and advanced materials.
Left: EDX element distribution of titanium nitride in steel
Right: EDX spectrum of titanium nitride in steel